文献
J-GLOBAL ID:201702255521690380
整理番号:17A1459844
磁気レオロジー研磨によるTEM試料調製のためのイオンビーム薄片化の最適化された前間伐方法【Powered by NICT】
Optimized pre-thinning procedures of ion-beam thinning for TEM sample preparation by magnetorheological polishing
著者 (7件):
Luo Hu
(College of Mechanical and Vehicle Engineering, Hunan University, Changsha, Hunan, 410082, PR China)
,
Yin Shaohui
(College of Mechanical and Vehicle Engineering, Hunan University, Changsha, Hunan, 410082, PR China)
,
Yin Shaohui
(Key Laboratory for Intelligent Laser Manufacturing of Hunan Province, Hunan University, Changsha, Hunan, 410082, PR China)
,
Zhang Guanhua
(College of Mechanical and Vehicle Engineering, Hunan University, Changsha, Hunan, 410082, PR China)
,
Liu Chunhui
(College of Material Science and Engineering, Hunan University, Changsha, Hunan, 410082, PR China)
,
Tang Qingchun
(College of Mechanical and Vehicle Engineering, Hunan University, Changsha, Hunan, 410082, PR China)
,
Guo Meijian
(College of Mechanical and Vehicle Engineering, Hunan University, Changsha, Hunan, 410082, PR China)
資料名:
Ultramicroscopy
(Ultramicroscopy)
巻:
181
ページ:
165-172
発行年:
2017年
JST資料番号:
W0972A
ISSN:
0304-3991
CODEN:
ULTRD
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)