文献
J-GLOBAL ID:201702256611248286
整理番号:17A1121810
有機薄膜トランジスタのトラップ状態と性能に及ぼす異性体純度の影響【Powered by NICT】
The Influence of Isomer Purity on Trap States and Performance of Organic Thin-Film Transistors
著者 (11件):
Diemer Peter J.
(Department of Physics, Wake Forest University, Winston-Salem, NC, 27109, USA)
,
Hayes Jacori
(Department of Physics, Wake Forest University, Winston-Salem, NC, 27109, USA)
,
Welchman Evan
(Department of Physics, Wake Forest University, Winston-Salem, NC, 27109, USA)
,
Hallani Rawad
(Department of Chemistry, University of Kentucky, Lexington, KY, 40506, USA)
,
Pookpanratana Sujitra J.
(Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA)
,
Hacker Christina A.
(Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA)
,
Richter Curt A.
(Engineering Physics Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA)
,
Anthony John E.
(Department of Chemistry, University of Kentucky, Lexington, KY, 40506, USA)
,
Thonhauser Timo
(Department of Physics, Wake Forest University, Winston-Salem, NC, 27109, USA)
,
Thonhauser Timo
(Department of Chemistry, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA)
,
Jurchescu Oana D.
(Department of Physics, Wake Forest University, Winston-Salem, NC, 27109, USA)
資料名:
Advanced Electronic Materials
(Advanced Electronic Materials)
巻:
3
号:
1
ページ:
null
発行年:
2017年
JST資料番号:
W2482A
ISSN:
2199-160X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)