文献
J-GLOBAL ID:201702256864380100
整理番号:17A0759443
AsとSb系高電子移動度トランジスタの雑音特性に関する比較研究【Powered by NICT】
Comparative study on noise characteristics of As and Sb-based high electron mobility transistors
著者 (4件):
Takahashi Takuto
(Department of Applied Electronics, Tokyo University of Science, 6-3-1 Niijuku, Katsushika-ku, Tokyo, 125-8585, Japan)
,
Hatsushiba Shota
(Department of Applied Electronics, Tokyo University of Science, 6-3-1 Niijuku, Katsushika-ku, Tokyo, 125-8585, Japan)
,
Fujikawa Sachie
(Department of Applied Electronics, Tokyo University of Science, 6-3-1 Niijuku, Katsushika-ku, Tokyo, 125-8585, Japan)
,
Fujishiro Hiroki I.
(Department of Applied Electronics, Tokyo University of Science, 6-3-1 Niijuku, Katsushika-ku, Tokyo, 125-8585, Japan)
資料名:
Physica Status Solidi. A. Applications and Materials Science
(Physica Status Solidi. A. Applications and Materials Science)
巻:
214
号:
3
ページ:
ROMBUNNO.201600599
発行年:
2017年
JST資料番号:
D0774A
ISSN:
1862-6300
CODEN:
PSSABA
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
ドイツ (DEU)
言語:
英語 (EN)