文献
J-GLOBAL ID:201702257357598282
整理番号:17A0911298
シリコン上の高性能2段階レシオメトリック波長モニターを統合【Powered by NICT】
Integrated High-Performance Two-Stage Ratiometric Wavelength Monitors On Silicon
著者 (7件):
Wang Gencheng
(College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China)
,
Dai Tingge
(College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China)
,
Chen Weiwei
(College of Information Science and Engineering, Ningbo University, Ningbo, China)
,
Wang Yuehai
(College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China)
,
Li Yubo
(College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China)
,
Jiang Xiaoqing
(College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China)
,
Yang Jianyi
(College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China)
資料名:
IEEE Photonics Technology Letters
(IEEE Photonics Technology Letters)
巻:
29
号:
10
ページ:
810-813
発行年:
2017年
JST資料番号:
T0721A
ISSN:
1041-1135
CODEN:
IPTLEL
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)