文献
J-GLOBAL ID:201702260450069663
整理番号:17A0400543
プロセス変動の下でのSRAMセルにおける抵抗性オープン欠陥を検出するためのハードウエア・ベースのアプローチの有効性【Powered by NICT】
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations
著者 (7件):
Gomez A.F.
(National Institute for Astrophysics, Optics and Electronics-INAOE, Mexico)
,
Lavratti F.
(Pontifical Catholic University of Rio Grande do Sul-PUCRS, Brazil)
,
Medeiros G.
(Pontifical Catholic University of Rio Grande do Sul-PUCRS, Brazil)
,
Sartori M.
(Pontifical Catholic University of Rio Grande do Sul-PUCRS, Brazil)
,
Poehls L. Bolzani
(Pontifical Catholic University of Rio Grande do Sul-PUCRS, Brazil)
,
Champac V.
(National Institute for Astrophysics, Optics and Electronics-INAOE, Mexico)
,
Vargas F.
(Pontifical Catholic University of Rio Grande do Sul-PUCRS, Brazil)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
67
ページ:
150-158
発行年:
2016年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)