文献
J-GLOBAL ID:201702260686631279
整理番号:17A1637424
関連プロセスに起因するフィールド故障の故障解析【Powered by NICT】
Failure analysis of a field failure return due to VIA related process
著者 (9件):
Luo Robert
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
,
Yu Dennis
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
,
Lai Lainni
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
,
Shen Abel
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
,
Wang Wilson
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
,
Li Ming
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
,
Chang Chiakung
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
,
Chen Jim
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
,
Xu Nina
(Monolithic Power System (MPS) Co., Ltd, 8, Kexin RD, West Park of High Tech Zone, Chengdu, China, 611731)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
IPFA
ページ:
1-4
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)