文献
J-GLOBAL ID:201702260696741739
整理番号:17A1717482
品質に関連したプロセスモニタリングのための潜在構造への並列射影【Powered by NICT】
Parallel projection to latent structures for quality-relevant process monitoring
著者 (5件):
Zheng Ying
(National Key Laboratory of Science and Technology on Multispectral Information Processing, School of Automation, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China)
,
Liu Ziwei
(National Key Laboratory of Science and Technology on Multispectral Information Processing, School of Automation, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China)
,
Yang Weidong
(National Key Laboratory of Science and Technology on Multispectral Information Processing, School of Automation, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China)
,
Tao Bo
(The State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China)
,
Wang Yanwei
(School of Mechanical and Electrical Engineering, Wuhan Institute of Technology, Wuhan 430073, China)
資料名:
Journal of the Taiwan Institute of Chemical Engineers
(Journal of the Taiwan Institute of Chemical Engineers)
巻:
80
ページ:
76-84
発行年:
2017年
JST資料番号:
W3224A
ISSN:
1876-1070
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)