文献
J-GLOBAL ID:201702261039770119
整理番号:17A0398677
飛行時間型二次イオン質量分析とX線光電子分光法により特性評価した清浄グラフェンおよびスパッタした黒鉛表面の欠陥【Powered by NICT】
Defects of clean graphene and sputtered graphite surfaces characterized by time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy
著者 (9件):
Xie Wenjing
(Division of Environment, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)
,
Weng Lu-Tao
(Department of Chemical and Biomolecular Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)
,
Weng Lu-Tao
(Materials Characterization and Preparation Facility, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)
,
Ng Kai Mo
(Advanced Engineering Materials Facility, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)
,
Chan Chak K.
(Division of Environment, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)
,
Chan Chak K.
(Department of Chemical and Biomolecular Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)
,
Chan Chak K.
(School of Energy and Environment, City University of Hong Kong, Hong Kong)
,
Chan Chi-Ming
(Division of Environment, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)
,
Chan Chi-Ming
(Department of Chemical and Biomolecular Engineering, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong)
資料名:
Carbon
(Carbon)
巻:
112
ページ:
192-200
発行年:
2017年
JST資料番号:
H0270B
ISSN:
0008-6223
CODEN:
CRBNA
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)