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J-GLOBAL ID:201702261171622734
整理番号:17A0852417
多重面内ゲートを有するプロトン伝導体横方向結合酸化物ベーストランジスタの神経形態学的シミュレーション【Powered by NICT】
Neuromorphic Simulation of Proton Conductors Laterally Coupled Oxide-Based Transistors With Multiple in-Plane Gates
著者 (6件):
Wan Xiang
(School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China)
,
Yang Yi
(School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China)
,
He Yongli
(School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China)
,
Feng Ping
(School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China)
,
Li Wenjun
(School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China)
,
Wan Qing
(School of Electronic Science and Engineering, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China)
資料名:
IEEE Electron Device Letters
(IEEE Electron Device Letters)
巻:
38
号:
4
ページ:
525-528
発行年:
2017年
JST資料番号:
B0344B
ISSN:
0741-3106
CODEN:
EDLEDZ
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)