文献
J-GLOBAL ID:201702262887475486
整理番号:17A0887443
多結晶シリコンウエハの亜結晶粒境界からの欠陥ルミネセンスの微視的分布【Powered by NICT】
Microscopic Distributions of Defect Luminescence From Subgrain Boundaries in Multicrystalline Silicon Wafers
著者 (8件):
Nguyen Hieu T.
(Research School of Engineering, Australian National University, Canberra, A.C.T., Australia)
,
Jensen Mallory A.
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Li Li
(Australian National Fabrication Facility, Department of Electronic Materials Engineering, Australian National University, Canberra, A.C.T., Australia)
,
Samundsett Christian
(Research School of Engineering, Australian National University, Canberra, A.C.T., Australia)
,
Sio Hang C.
(Research School of Engineering, Australian National University, Canberra, A.C.T., Australia)
,
Lai Barry
(Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA)
,
Buonassisi Tonio
(Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Macdonald Daniel
(Research School of Engineering, Australian National University, Canberra, A.C.T., Australia)
資料名:
IEEE Journal of Photovoltaics
(IEEE Journal of Photovoltaics)
巻:
7
号:
3
ページ:
772-780
発行年:
2017年
JST資料番号:
W2305A
ISSN:
2156-3381
CODEN:
IJPEG8
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)