文献
J-GLOBAL ID:201702263885941073
整理番号:17A1419223
温度キャリブレーション法に基づく低温での分光放射率測定のための改良されたアルゴリズム【Powered by NICT】
An improved algorithm for spectral emissivity measurements at low temperatures based on the multi-temperature calibration method
著者 (5件):
Zhang Kaihua
(School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, PR China)
,
Yu Kun
(Infrared Optoelectronic Science and Technology Key Laboratory of Henan Province, College of Physics and Materials Science, Henan Normal University, Xinxiang, Henan 453007, PR China)
,
Liu Yufang
(School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, PR China)
,
Liu Yufang
(Infrared Optoelectronic Science and Technology Key Laboratory of Henan Province, College of Physics and Materials Science, Henan Normal University, Xinxiang, Henan 453007, PR China)
,
Zhao Yuejin
(School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, PR China)
資料名:
International Journal of Heat and Mass Transfer
(International Journal of Heat and Mass Transfer)
巻:
114
ページ:
1037-1044
発行年:
2017年
JST資料番号:
C0390A
ISSN:
0017-9310
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)