文献
J-GLOBAL ID:201702264408646829
整理番号:17A0834005
BiFeO_3薄膜におけるドメイン工学【Powered by NICT】
Domain engineering in BiFeO3 thin films
著者 (5件):
Baek Seung-Hyub
(Center for Electronic Materials, Korea Institute of Science and Technology, Seoul, 136-791, Republic of Korea)
,
Baek Seung-Hyub
(Department of Nanomaterials Science and Technology, Korea University of Science and Technology, Daejeon, 305-333, Republic of Korea)
,
Choi Seokhoon
(Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea)
,
Kim Taemin Ludvic
(Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea)
,
Jang Ho Won
(Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea)
資料名:
Current Applied Physics
(Current Applied Physics)
巻:
17
号:
5
ページ:
688-703
発行年:
2017年
JST資料番号:
W1579A
ISSN:
1567-1739
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)