文献
J-GLOBAL ID:201702264647015675
整理番号:17A1262386
分子ビームエピタクシーによるGaN再成長を用いた1.1kV垂直GaN PNダイオード【Powered by NICT】
1.1-kV Vertical GaN p-n Diodes With p-GaN Regrown by Molecular Beam Epitaxy
著者 (8件):
Hu Zongyang
(School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA)
,
Nomoto Kazuki
(School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA)
,
Qi Meng
(Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN, USA)
,
Li Wenshen
(School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA)
,
Zhu Mingda
(School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA)
,
Gao Xiang
(IQE RF LLC, Somerset, NJ, USA)
,
Jena Debdeep
(Department of Materials Science and Engineering, School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA)
,
Xing Huili Grace
(Department of Materials Science and Engineering, School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA)
資料名:
IEEE Electron Device Letters
(IEEE Electron Device Letters)
巻:
38
号:
8
ページ:
1071-1074
発行年:
2017年
JST資料番号:
B0344B
ISSN:
0741-3106
CODEN:
EDLEDZ
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)