文献
J-GLOBAL ID:201702266248297651
整理番号:17A0048036
バイポーラ電荷輸送モデルに基づく低エネルギー電子線照射PTFEのシミュレーション
Simulation of low-energy electron beam irradiated PTFE based on bipolar charge transport model
著者 (5件):
Li Shengtao
(State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, China)
,
Zhao Changhao
(State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, China)
,
Min Daomin
(State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, China)
,
Pan Shaoming
(State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, China)
,
Yu Yingying
(State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, China)
資料名:
IEEE Transactions on Dielectrics and Electrical Insulation
(IEEE Transactions on Dielectrics and Electrical Insulation)
巻:
23
号:
5
ページ:
3016-3025
発行年:
2016年
JST資料番号:
W0578A
ISSN:
1070-9878
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)