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J-GLOBAL ID:201702266834256086
整理番号:17A1170251
記録的に高い感度を持つ完全印刷銀ナノ粒子ベース歪ゲージ【Powered by NICT】
Fully Printed Silver-Nanoparticle-Based Strain Gauges with Record High Sensitivity
著者 (8件):
Zhang Suoming
(Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, USA)
,
Cai Le
(Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, USA)
,
Li Wei
(Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, USA)
,
Miao Jinshui
(Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, USA)
,
Wang Tongyu
(Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, USA)
,
Yeom Junghoon
(Mechanical Engineering, Michigan State University, East Lansing, MI, 48824, USA)
,
Sepulveda Nelson
(Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, USA)
,
Wang Chuan
(Electrical and Computer Engineering, Michigan State University, East Lansing, MI, 48824, USA)
資料名:
Advanced Electronic Materials
(Advanced Electronic Materials)
巻:
3
号:
7
ページ:
ROMBUNNO.201700067
発行年:
2017年
JST資料番号:
W2482A
ISSN:
2199-160X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)