文献
J-GLOBAL ID:201702268506056992
整理番号:17A0328641
信頼性強化のための新しいキャッシュ利用に基づく動的電圧-周波数スケーリング機構【Powered by NICT】
A Novel Cache-Utilization-Based Dynamic Voltage-Frequency Scaling Mechanism for Reliability Enhancements
著者 (5件):
Chen Yen-Hao
(Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan)
,
Tang Yi-Lun
(Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan)
,
Liu Yi-Yu
(Department of Computer Science and Engineering, Yuan Ze University, Taoyuan, Taiwan)
,
Wu Allen C.-H.
(School of Digital Media, Jiangnan University, Wuxi, China)
,
Hwang TingTing
(Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan)
資料名:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
(IEEE Transactions on Very Large Scale Integration (VLSI) Systems)
巻:
25
号:
3
ページ:
820-832
発行年:
2017年
JST資料番号:
W0516A
ISSN:
1063-8210
CODEN:
ITCOB4
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)