文献
J-GLOBAL ID:201702268535102243
整理番号:17A0055472
4H-SiCエピタキシャル層とその特性に基づく粒子検出器【Powered by NICT】
Particle detectors based on 4H-SiC epitaxial layer and their properties
著者 (10件):
Zat’ko B.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, SK-841 04 Bratislava, Slovakia)
,
Hrubcin L.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, SK-841 04 Bratislava, Slovakia)
,
Sagatova A.
(Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology, Ilkovic∨ova 3, SK-812 19 Bratislava, Slovak Republic)
,
Bohacek P.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, SK-841 04 Bratislava, Slovakia)
,
Dubecky F.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, SK-841 04 Bratislava, Slovakia)
,
Sedlackova K.
(Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology, Ilkovic∨ova 3, SK-812 19 Bratislava, Slovak Republic)
,
Sekacova M.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, SK-841 04 Bratislava, Slovakia)
,
Arbet J.
(Institute of Electrical Engineering, Slovak Academy of Sciences, Du ́bravska ́ cesta 9, SK-841 04 Bratislava, Slovakia)
,
Necas V.
(Slovak University of Technology in Bratislava, Faculty of Electrical Engineering and Information Technology, Ilkovic∨ova 3, SK-812 19 Bratislava, Slovak Republic)
,
Skuratov V. A.
(Joint Institute for Nuclear Research, Joliot-Curie 6, RUS-141980 Dubna, Moscow Region, Russia)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
ASDAM
ページ:
141-144
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)