文献
J-GLOBAL ID:201702268558243389
整理番号:17A0852596
再利用パワーゲーティングインフラストラクチャによるB TIエージングの粗視化オンラインモニタリング【Powered by NICT】
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure
著者 (6件):
Tenentes Vasileios
(Department of Electronics and Computer Science, University of Southampton, Southampton, U.K.)
,
Rossi Daniele
(Department of Electronics and Computer Science, University of Southampton, Southampton, U.K.)
,
Yang Sheng
(ARM Ltd., Cambridge, U.K.)
,
Khursheed Saqib
(Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool, U.K.)
,
Al-Hashimi Bashir M.
(Department of Electronics and Computer Science, University of Southampton, Southampton, U.K.)
,
Gunn Steve R.
(Department of Electronics and Computer Science, University of Southampton, Southampton, U.K.)
資料名:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
(IEEE Transactions on Very Large Scale Integration (VLSI) Systems)
巻:
25
号:
4
ページ:
1397-1407
発行年:
2017年
JST資料番号:
W0516A
ISSN:
1063-8210
CODEN:
ITCOB4
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)