文献
J-GLOBAL ID:201702268630888804
整理番号:17A0404111
多重アークイオンめっきにより蒸着したAl-Ti-N膜の微細構造と性質に及ぼす負バイアス電圧の影響【Powered by NICT】
Influence of negative bias voltage on microstructure and property of Al-Ti-N films deposited by multi-arc ion plating
著者 (6件):
Cai Fei
(Research Center of Modern Surface and Interface Engineering, Anhui University of Technology, Maanshan City, Anhui Province 243002, PR China)
,
Chen Mohan
(Research Center of Modern Surface and Interface Engineering, Anhui University of Technology, Maanshan City, Anhui Province 243002, PR China)
,
Chen Mohan
(School of Materials Science and Engineering, Anhui University of Technology, Maanshan City, Anhui Province 243002, PR China)
,
Li Mingxi
(School of Materials Science and Engineering, Anhui University of Technology, Maanshan City, Anhui Province 243002, PR China)
,
Zhang Shihong
(Research Center of Modern Surface and Interface Engineering, Anhui University of Technology, Maanshan City, Anhui Province 243002, PR China)
,
Zhang Shihong
(School of Materials Science and Engineering, Anhui University of Technology, Maanshan City, Anhui Province 243002, PR China)
資料名:
Ceramics International
(Ceramics International)
巻:
43
号:
4
ページ:
3774-3783
発行年:
2017年
JST資料番号:
H0705A
ISSN:
0272-8842
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)