文献
J-GLOBAL ID:201702268664483473
整理番号:17A0852189
スルー反射線路キャリブレーション技術線標準の特性インピーダンス変化のための誤差解析【Powered by NICT】
Thru-Reflect-Line Calibration Technique: Error Analysis for Characteristic Impedance Variations in the Line Standards
著者 (7件):
Ye Lingyun
(College of Biomedical Engineering and Instrument Science, Zhejiang University, Hangzhou, China)
,
Li Caixia
(College of Biomedical Engineering and Instrument Science, Zhejiang University, Hangzhou, China)
,
Sun Xinglin
(College of Biomedical Engineering and Instrument Science, Zhejiang University, Hangzhou, China)
,
Jin Shuai
(EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA)
,
Chen Bichen
(EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA)
,
Ye Xiaoning
(Data Center and Connected Systems Group, Intel Corp., Hillsboro, OR, USA)
,
Fan Jun
(EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA)
資料名:
IEEE Transactions on Electromagnetic Compatibility
(IEEE Transactions on Electromagnetic Compatibility)
巻:
59
号:
3
ページ:
779-788
発行年:
2017年
JST資料番号:
H0383A
ISSN:
0018-9375
CODEN:
IEMCAE
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)