文献
J-GLOBAL ID:201702269223945235
整理番号:17A1492136
4チャネル量子カスケードレーザの外部共振器ビーム結合【Powered by NICT】
External-cavity beam combining of 4-channel quantum cascade lasers
著者 (22件):
Zhao Yue
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Zhao Yue
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Zhang Jin-Chuan
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Zhang Jin-Chuan
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Zhou Yu-Hong
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Zhou Yu-Hong
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Jia Zhi-Wei
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Jia Zhi-Wei
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Zhuo Ning
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Zhuo Ning
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Zhai Shen-Qiang
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Zhai Shen-Qiang
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Wang Li-Jun
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Wang Li-Jun
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Liu Jun-Qi
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Liu Jun-Qi
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Liu Shu-Man
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Liu Shu-Man
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Liu Feng-Qi
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Liu Feng-Qi
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
,
Wang Zhan-Guo
(Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing Key Laboratory of Low Dimensional Semiconductor Materials and Devices, Beijing 100083, China)
,
Wang Zhan-Guo
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 101408, China)
資料名:
Infrared Physics & Technology
(Infrared Physics & Technology)
巻:
85
ページ:
52-55
発行年:
2017年
JST資料番号:
H0184A
ISSN:
1350-4495
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)