文献
J-GLOBAL ID:201702269337046045
整理番号:17A0453196
簡単な引かき法によるナノ溝SiO_2誘電層上のペンタセン分子と輸送異方性の表面誘起配向有機薄膜トランジスタの移動度に及ぼす表面粗さと分子配向の研究【Powered by NICT】
Surface-induced orientation of pentacene molecules and transport anisotropy on nanogroove SiO2 dielectric layer by simple scratched method: The study of surface roughness and molecular alignment on the mobility of organic thin film transistors
著者 (9件):
Kim Aryeon
(Division of Advanced Materials, Korea Research Institute of Chemical Technology, Daejeon, 34114, Republic of Korea)
,
Choi Won Jin
(Division of Advanced Materials, Korea Research Institute of Chemical Technology, Daejeon, 34114, Republic of Korea)
,
Jang Kwang-Suk
(Department of Chemical Engineering, Hankyong National University, Anseong, 17579, Republic of Korea)
,
Jeong Hyeonsu
(Institute of Advanced Composite Materials, Korea Institute of Science and Technology, Wanju-gun, Jeonbuk 55324, Republic of Korea)
,
Kim Jinsoo
(Division of Advanced Materials, Korea Research Institute of Chemical Technology, Daejeon, 34114, Republic of Korea)
,
Ka Jae-Won
(Division of Advanced Materials, Korea Research Institute of Chemical Technology, Daejeon, 34114, Republic of Korea)
,
Won Jong Chan
(Division of Advanced Materials, Korea Research Institute of Chemical Technology, Daejeon, 34114, Republic of Korea)
,
Lee Jeong-O.
(Division of Advanced Materials, Korea Research Institute of Chemical Technology, Daejeon, 34114, Republic of Korea)
,
Kim Yun Ho
(Division of Advanced Materials, Korea Research Institute of Chemical Technology, Daejeon, 34114, Republic of Korea)
資料名:
Organic Electronics
(Organic Electronics)
巻:
42
ページ:
316-321
発行年:
2017年
JST資料番号:
W1352A
ISSN:
1566-1199
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)