文献
J-GLOBAL ID:201702270383157238
整理番号:17A0662510
オンチップ赤外分光センシング:スケーリングの利点を再定義する【Powered by NICT】
On-Chip Infrared Spectroscopic Sensing: Redefining the Benefits of Scaling
著者 (7件):
Kita Derek M.
(Department of Materials Science & Engineering and Materials Processing Center, Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Lin Hongtao
(Department of Materials Science & Engineering and Materials Processing Center, Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Agarwal Anu
(Department of Materials Science & Engineering and Materials Processing Center, Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Richardson Kathleen
(College of Optics and Photonics, CREOL, University of Central Florida, Orlando, FL, USA)
,
Luzinov Igor
(Department of Materials Science & Engineering, Clemson University, Clemson, SC, USA)
,
Gu Tian
(Department of Materials Science & Engineering and Materials Processing Center, Massachusetts Institute of Technology, Cambridge, MA, USA)
,
Hu Juejun
(Department of Materials Science & Engineering and Materials Processing Center, Massachusetts Institute of Technology, Cambridge, MA, USA)
資料名:
IEEE Journal of Selected Topics in Quantum Electronics
(IEEE Journal of Selected Topics in Quantum Electronics)
巻:
23
号:
2
ページ:
ROMBUNNO.5900110.1-10
発行年:
2017年
JST資料番号:
W0734A
ISSN:
1077-260X
CODEN:
IJSQEN
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)