文献
J-GLOBAL ID:201702270697353404
整理番号:17A0146389
拡張カーネル回帰分析法を用いたシミュレーション実験を結合するための多重解像度法【Powered by NICT】
Extended Kernel Regression: A multi-resolution method to combine simulation experiments with analytical methods
著者 (4件):
Ziwei Lin
(Department of Industrial Engineering & Management, School of Mechanical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, 200240, CHINA)
,
Matta Andrea
(Department of Industrial Engineering & Management, School of Mechanical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, 200240, CHINA)
,
Na Li
(Department of Industrial Engineering & Management, School of Mechanical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, 200240, CHINA)
,
Shanthikumar J. George
(Krannert School of Management, Purdue University, 100 S. Grant Street, West Lafayette, IN 47907-2076, USA)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
WSC
ページ:
590-601
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)