文献
J-GLOBAL ID:201702272495893649
整理番号:17A0312234
明示的長さと欠陥の深さの両方を考慮した検出確率の実証【Powered by NICT】
Demonstration of probability of detection taking consideration of both the length and the depth of a flaw explicitly
著者 (3件):
Yusa Noritaka
(Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan)
,
Chen Weixi
(Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan)
,
Hashizume Hidetoshi
(Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan)
資料名:
NDT & E International
(NDT & E International)
巻:
81
ページ:
1-8
発行年:
2016年07月
JST資料番号:
A0196A
ISSN:
0963-8695
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)