文献
J-GLOBAL ID:201702274768288632
整理番号:17A1457414
プラズマホットスポット診断のための新しいX線スペクトロメータ【Powered by NICT】
A novel X-ray spectrometer for plasma hot spot diagnosis
著者 (7件):
Shi Jun
(The Key Laboratory of Optoelectronic Technology and System, Ministry of Education, Chongqing University, Chongqing 400044, China)
,
Guo Yongchao
(The Key Laboratory of Optoelectronic Technology and System, Ministry of Education, Chongqing University, Chongqing 400044, China)
,
Xiao Shali
(The Key Laboratory of Optoelectronic Technology and System, Ministry of Education, Chongqing University, Chongqing 400044, China)
,
Yang Zuhua
(Research Center of Laser Fusion, CAEP, P.O. Box 919-988, Mianyang 621900, China)
,
Qian Feng
(Research Center of Laser Fusion, CAEP, P.O. Box 919-988, Mianyang 621900, China)
,
Cao LeiFeng
(Research Center of Laser Fusion, CAEP, P.O. Box 919-988, Mianyang 621900, China)
,
Gu Yuqiu
(Research Center of Laser Fusion, CAEP, P.O. Box 919-988, Mianyang 621900, China)
資料名:
Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment
(Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment)
巻:
866
ページ:
72-75
発行年:
2017年
JST資料番号:
D0208B
ISSN:
0168-9002
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)