文献
J-GLOBAL ID:201702274964752357
整理番号:17A1444963
すべて層状2次元オプトエレクトロニクス:Bi_2Te_3トポロジカル絶縁体電極を用いた高性能UV-vis-NIR広帯域SnSe光検出器【Powered by NICT】
All-Layered 2D Optoelectronics: A High-Performance UV-vis-NIR Broadband SnSe Photodetector with Bi2Te3 Topological Insulator Electrodes
著者 (3件):
Yao Jiandong
(State Key Laboratory of Optoelectronic Materials and Technologies, Nanotechnology Research Center, School of Materials Science and Engineering, School of Physics, Sun Yat-sen University, Guangzhou, Guangdong, 510275, P. R. China)
,
Zheng Zhaoqiang
(State Key Laboratory of Optoelectronic Materials and Technologies, Nanotechnology Research Center, School of Materials Science and Engineering, School of Physics, Sun Yat-sen University, Guangzhou, Guangdong, 510275, P. R. China)
,
Yang Guowei
(State Key Laboratory of Optoelectronic Materials and Technologies, Nanotechnology Research Center, School of Materials Science and Engineering, School of Physics, Sun Yat-sen University, Guangzhou, Guangdong, 510275, P. R. China)
資料名:
Advanced Functional Materials
(Advanced Functional Materials)
巻:
27
号:
33
ページ:
ROMBUNNO.201701823
発行年:
2017年
JST資料番号:
W1336A
ISSN:
1616-301X
CODEN:
AFMDC6
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
ドイツ (DEU)
言語:
英語 (EN)