文献
J-GLOBAL ID:201702275072172779
整理番号:17A1391408
デュアルゲート構造を用いたゲートリセス型AlGaN/GaNトランジスタのサブしきい値特性の改善【Powered by NICT】
Improvement of Subthreshold Characteristic of Gate-Recessed AlGaN/GaN Transistors by Using Dual-Gate Structure
著者 (13件):
Yang Ling
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of advanced materials and nanotechnology, Xidian University, Xi’an, China)
,
Mi Minhan
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, China)
,
Hou Bin
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of advanced materials and nanotechnology, Xidian University, Xi’an, China)
,
Zhu Jiejie
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of advanced materials and nanotechnology, Xidian University, Xi’an, China)
,
Zhang Meng
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of advanced materials and nanotechnology, Xidian University, Xi’an, China)
,
He Yunlong
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, China)
,
Lu Yang
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, China)
,
Zhu Qing
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of advanced materials and nanotechnology, Xidian University, Xi’an, China)
,
Zhou Xiaowei
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of advanced materials and nanotechnology, Xidian University, Xi’an, China)
,
Lv Ling
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of advanced materials and nanotechnology, Xidian University, Xi’an, China)
,
Cao Yanrong
(School of Mechano-Electronic Engineering, Xidian University, Xi’an, China)
,
Ma Xiaohua
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of advanced materials and nanotechnology, Xidian University, Xi’an, China)
,
Hao Yue
(State Key Discipline Laboratory of Wide Band-Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, China)
資料名:
IEEE Transactions on Electron Devices
(IEEE Transactions on Electron Devices)
巻:
64
号:
10
ページ:
4057-4064
発行年:
2017年
JST資料番号:
C0222A
ISSN:
0018-9383
CODEN:
IETDAI
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)