文献
J-GLOBAL ID:201702275515925616
整理番号:17A1731094
多重相互接続欠陥の身体特性を認識した診断【Powered by NICT】
Physical-aware diagnosis of multiple interconnect defects
著者 (5件):
Chen Po-Hao
(Lab. of Dependable Systems (LaDS), Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan)
,
Lee Chi-Lin
(Lab. of Dependable Systems (LaDS), Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan)
,
Chen Jing-Yu
(Lab. of Dependable Systems (LaDS), Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan)
,
Chen Po-Wei
(Lab. of Dependable Systems (LaDS), Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan)
,
Li James Chien-Mo
(Lab. of Dependable Systems (LaDS), Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ITC-Asia
ページ:
40-45
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)