文献
J-GLOBAL ID:201702275580453772
整理番号:17A1348164
ESD寄生容量の正確な抽出の研究【Powered by NICT】
A study of accurate extraction of ESD parasitic capacitance
著者 (9件):
Chenkun Wang
(Dept. of ECE, University of California, Riverside, 92521, USA)
,
Fei Lu
(Dept. of ECE, University of California, Riverside, 92521, USA)
,
Rui Ma
(Dept. of ECE, University of California, Riverside, 92521, USA)
,
Qi Chen
(Dept. of ECE, University of California, Riverside, 92521, USA)
,
Feilong Zhang
(Dept. of ECE, University of California, Riverside, 92521, USA)
,
Cheng Li
(Dept. of ECE, University of California, Riverside, 92521, USA)
,
Yuhua Cheng
(Peking University, China)
,
Tianshen Tang
(Semiconductor Manufacturing International Corporation, China)
,
Wang Albert
(Dept. of ECE, University of California, Riverside, 92521, USA)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
ICSICT
ページ:
437-440
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)