文献
J-GLOBAL ID:201702275943240555
整理番号:17A1727266
回復効果とその回路設計に対する統一老化モデル【Powered by NICT】
A unified aging model with recovery effect and its impact on circuit design
著者 (10件):
Lee Wai-Kit
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Huang Kasa
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Hsu Li Chung
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Huang Clement
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Liang Jim
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Chen Julian
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Hsiao Cheng
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Su Ke-Wei
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Lin Chung-Kai
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
,
Jeng Min-Chie
(Taiwan Semiconductor Manufacturing Company, 168, Park Ave 2, Hsin-Chu Science Park, Hsin-Chu County, Taiwan 308-44, R.O.C)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
SISPAD
ページ:
93-96
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)