文献
J-GLOBAL ID:201702277266145260
整理番号:17A0417635
細胞RFICのための0.14ps_rmsジッタと 78dBc分数スパーを持つ24.8A14nm分数NディジタルPLL【Powered by NICT】
24.8 A 14nm fractional-N digital PLL with 0.14psrms jitter and -78dBc fractional spur for cellular RFICs
著者 (18件):
Yao Chih-Wei
(Samsung Semiconductor, San Jose, CA, United States of America)
,
Loke Wing Fai
(Samsung Semiconductor, San Jose, CA, United States of America)
,
Ni Ronghua
(Samsung Semiconductor, San Jose, CA, United States of America)
,
Han Yongping
(Samsung Semiconductor, San Jose, CA, United States of America)
,
Li Haoyang
(Samsung Semiconductor, San Jose, CA, United States of America)
,
Godbole Kunal
(Samsung Semiconductor, San Jose, CA, United States of America)
,
Zuo Yongrong
(Samsung Semiconductor, San Jose, CA, United States of America)
,
Ko Sangsoo
(Samsung Electronics, Hwasung, Korea)
,
Kim Nam-Seog
(Samsung Electronics, Hwasung, Korea)
,
Han Sangwook
(Samsung Electronics, Hwasung, Korea)
,
Jo Ikkyun
(Samsung Electronics, Hwasung, Korea)
,
Lee Joonhee
(Samsung Electronics, Hwasung, Korea)
,
Han Juyoung
(Samsung Electronics, Hwasung, Korea)
,
Kwon Daehyeon
(Samsung Electronics, Hwasung, Korea)
,
Kim Chulho
(Samsung Electronics, Hwasung, Korea)
,
Kim Shinwoong
(Samsung Electronics, Hwasung, Korea)
,
Son Sang Won
(Samsung Semiconductor, San Jose, CA, United States of America)
,
Cho Thomas Byunghak
(Samsung Electronics, Hwasung, Korea)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ISSCC
ページ:
422-423
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)