文献
J-GLOBAL ID:201702278531389235
整理番号:17A0020898
非晶質InGaZnO薄膜トランジスタの光照射安定性に及ぼす環境の影響【Powered by NICT】
Ambient effects on the light illumination stability of amorphous InGaZnO thin film transistors
著者 (6件):
Xu Jianeng
(Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China)
,
Xie Haiting
(Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China)
,
Liu Guochao
(Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China)
,
Zhang Lei
(Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China)
,
Tong Xianyu
(Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China)
,
Dong Chengyuan
(Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
CAD-TFT
ページ:
1
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)