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J-GLOBAL ID:201702279823589751
整理番号:17A0852600
SRAMセンス増幅器にB TI,PVT変動,および作業負荷の積分影響【Powered by NICT】
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier
著者 (8件):
Agbo Innocent
(Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands)
,
Taouil Mottaqiallah
(Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands)
,
Kraak Daniel
(Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands)
,
Hamdioui Said
(Computer Engineering Laboratory, Delft University of Technology, Delft, CD, The Netherlands)
,
Kukner Halil
(GLOBALFOUNDRIES, Singapore)
,
Weckx Pieter
(IMEC vzw, Leuven, Belgium)
,
Raghavan Praveen
(IMEC vzw, Leuven, Belgium)
,
Catthoor Francky
(IMEC vzw, Leuven, Belgium)
資料名:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
(IEEE Transactions on Very Large Scale Integration (VLSI) Systems)
巻:
25
号:
4
ページ:
1444-1454
発行年:
2017年
JST資料番号:
W0516A
ISSN:
1063-8210
CODEN:
ITCOB4
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)