文献
J-GLOBAL ID:201702281377340262
整理番号:17A0965738
高品質不動態化を用いたテクスチャードシリコン基板上に真性水素化非晶質シリコン(a Si:H)薄膜の研究【Powered by NICT】
Investigation of intrinsic hydrogenated amorphous silicon (a-Si:H) thin films on textured silicon substrate with high quality passivation
著者 (5件):
Min-Lun Yu
(Department of Energy Engineering, National Central University, Taoyuan, Taiwan (R.O.C.))
,
Yu-Lin Hsieh
(Department of Mechanical Engineering, National Central University, Taoyuan, Taiwan (R.O.C.))
,
Sheng-Kai Jou
(Department of Mechanical Engineering, National Central University, Taoyuan, Taiwan (R.O.C.))
,
Li Tomi T.
(Department of Mechanical Engineering, National Central University, Taoyuan, Taiwan (R.O.C.))
,
Chien-Chieh Lee
(Optical Science Center, National Central University, Taoyuan, Taiwan (R.O.C.))
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
CSTIC
ページ:
1-3
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)