文献
J-GLOBAL ID:201702283764968887
整理番号:17A1705395
薄い電解質層下でのすずの腐食挙動に及ぼす電場とバイアス電圧の影響【Powered by NICT】
Effects of electric field and bias voltage on corrosion behavior of tin under a thin electrolyte layer
著者 (2件):
Huang Hualiang
(School of Chemistry and Environmental Engineering, Key Laboratory of Green Chemical Process of Ministry of Education, Key Laboratory of Novel Reactor and Green Chemical Technology of Hubei Province, Wuhan Institute of Technology, Wuhan 430074, PR China)
,
Tian Jing
(School of Chemistry and Environmental Engineering, Key Laboratory of Green Chemical Process of Ministry of Education, Key Laboratory of Novel Reactor and Green Chemical Technology of Hubei Province, Wuhan Institute of Technology, Wuhan 430074, PR China)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
78
ページ:
131-142
発行年:
2017年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)