文献
J-GLOBAL ID:201702283774497322
整理番号:17A0168276
小角X線散乱バックグラウンドの反復かつ正確な決定【Powered by NICT】
Iterative and accurate determination of small angle X-ray scattering background
著者 (8件):
Wang Geng
(Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences)
,
Xu Lifeng
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences)
,
Shen Jianlei
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences)
,
Yao Guangbao
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences)
,
Ge Zhilei
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences)
,
Li Wenqin
(Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences)
,
Fan Chunhai
(Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences)
,
Chen Gang
(Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences)
資料名:
Hejishu(Yingwenban)
(Hejishu(Yingwenban))
巻:
27
号:
5
ページ:
105-1-105-5
発行年:
2016年
JST資料番号:
C2619A
ISSN:
1001-8042
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
中国 (CHN)
言語:
英語 (EN)