文献
J-GLOBAL ID:201702283989790401
整理番号:17A0955196
トンネル効果を高めることによるトンネル電界効果トランジスタのトンネル確率のゆらぎの抑制
Suppression of tunneling rate fluctuations in tunnel field-effect transistors by enhancing tunneling probability
著者 (14件):
MORI Takahiro
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
MIGITA Shinji
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
FUKUDA Koichi
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
ASAI Hidehiro
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
MORITA Yukinori
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
MIZUBAYASHI Wataru
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
LIU Yongxun
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
O’UCHI Shin-ichi
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
FUKETA Hiroshi
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
OTSUKA Shintaro
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
YASUDA Tetsuji
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
MASAHARA Meishoku
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
OTA Hiroyuki
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
MATSUKAWA Takashi
(National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
資料名:
Japanese Journal of Applied Physics
(Japanese Journal of Applied Physics)
巻:
56
号:
4S
ページ:
04CD02.1-04CD02.5
発行年:
2017年04月
JST資料番号:
G0520B
ISSN:
0021-4922
CODEN:
JJAPB6
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)