文献
J-GLOBAL ID:201702284201686610
整理番号:17A0400967
Ge_xAs_35 xSe_65薄膜の温度依存性光学モードの研究:構造特異的Raman,遠赤外及び光吸収分光法【Powered by NICT】
Investigation of temperature dependent optical modes in GexAs35-xSe65 thin films: Structure specific Raman, FIR and optical absorption spectroscopy
著者 (6件):
Khan Pritam
(Department of Physics, Indian Institute of Science Education and Research, Bhopal 462023, India)
,
Bhattacharya Arinjoy
(Department of Physics, Indian Institute of Science Education and Research, Bhopal 462023, India)
,
Joshy Abin
(Department of Physics, Indian Institute of Science Education and Research, Bhopal 462023, India)
,
Sathe Vasant
(UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452017, India)
,
Deshpande Uday
(UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore 452017, India)
,
Adarsh K.V.
(Department of Physics, Indian Institute of Science Education and Research, Bhopal 462023, India)
資料名:
Thin Solid Films
(Thin Solid Films)
巻:
621
ページ:
76-83
発行年:
2017年
JST資料番号:
B0899A
ISSN:
0040-6090
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)