文献
J-GLOBAL ID:201702284509601137
整理番号:17A1639071
電荷プラズマdopinglessデバイスにおける衝突イオン化とトンネル掘削作業【Powered by NICT】
Impact ionization and tunneling operations in charge-plasma dopingless device
著者 (8件):
Kim Minsuk
(Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea)
,
Kim Yoonjoong
(Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea)
,
Lim Doohyeok
(Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea)
,
Woo Sola
(Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea)
,
Im Kyeungmin
(Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea)
,
Cho Jinsun
(Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea)
,
Kang Hyungu
(Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea)
,
Kim Sangsig
(Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul, 02841, Republic of Korea)
資料名:
Superlattices and Microstructures
(Superlattices and Microstructures)
巻:
111
ページ:
796-805
発行年:
2017年
JST資料番号:
D0600B
ISSN:
0749-6036
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)