文献
J-GLOBAL ID:201702284902487517
整理番号:17A0374495
パターン化されたSi(001)基板上に成長させたエピタキシャルGe結晶の歪緩和【Powered by NICT】
Strain relaxation in epitaxial Ge crystals grown on patterned Si(001) substrates
著者 (9件):
Arroyo Rojas Dasilva Yadira
(Electron Microscopy Center, EMPA, Swiss Federal Laboratories for Materials Science and Technology, UEberlandstrasse 129, Duebendorf CH-8600, Switzerland)
,
Rossell Marta D.
(Electron Microscopy Center, EMPA, Swiss Federal Laboratories for Materials Science and Technology, UEberlandstrasse 129, Duebendorf CH-8600, Switzerland)
,
Isa Fabio
(Electron Microscopy Center, EMPA, Swiss Federal Laboratories for Materials Science and Technology, UEberlandstrasse 129, Duebendorf CH-8600, Switzerland)
,
Isa Fabio
(Laboratory for Solid State Physics, ETH Zuerich, Otto-Stern-Weg 1, Zuerich CH-8093, Switzerland)
,
Erni Rolf
(Electron Microscopy Center, EMPA, Swiss Federal Laboratories for Materials Science and Technology, UEberlandstrasse 129, Duebendorf CH-8600, Switzerland)
,
Isella Giovanni
(L-NESS and Department of Physics, Politecnico di Milano and IFN-CNR, Via Anzani 42, Como I-22100, Italy)
,
Kaenel Hans von
(Electron Microscopy Center, EMPA, Swiss Federal Laboratories for Materials Science and Technology, UEberlandstrasse 129, Duebendorf CH-8600, Switzerland)
,
Kaenel Hans von
(Laboratory for Solid State Physics, ETH Zuerich, Otto-Stern-Weg 1, Zuerich CH-8093, Switzerland)
,
Groning Pierangelo
(Department of Advanced Materials and Surfaces, EMPA, Swiss Federal Laboratories for Materials Science and Technology, UEberlandstrasse 129,CH-8600 Duebendorf, Switzerland)
資料名:
Scripta Materialia
(Scripta Materialia)
巻:
127
ページ:
169-172
発行年:
2017年
JST資料番号:
B0915A
ISSN:
1359-6462
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)