文献
J-GLOBAL ID:201702285026140094
整理番号:17A1235855
X線蛍光を用いた銀強度マッピングによる放射線フィルムのための可視化法【Powered by NICT】
Visualization method for radiographic films through silver intensity mapping using X-ray fluorescence
著者 (8件):
Goncalves E.A.S.
(Federal Institute of Rio de Janeiro, Rio de Janeiro, Brazil)
,
Goncalves E.A.S.
(Physics Institute, Rio de Janeiro State University, Rio de Janeiro, Brazil)
,
Oliveira D.F.
(Nuclear Instrumentation Laboratory, COPPE, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil)
,
Oliveira D.F.
(Physics Institute, Rio de Janeiro State University, Rio de Janeiro, Brazil)
,
Anjos M.J.
(Physics Institute, Rio de Janeiro State University, Rio de Janeiro, Brazil)
,
Assis J.T.
(Department of Mechanical Engineering and Energy, Polytechnic Institute, Rio de Janeiro State University, Rio de Janeiro, Brazil)
,
Oliveira L.F.
(Physics Institute, Rio de Janeiro State University, Rio de Janeiro, Brazil)
,
Lopes R.T.
(Nuclear Instrumentation Laboratory, COPPE, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil)
資料名:
X-Ray Spectrometry
(X-Ray Spectrometry)
巻:
46
号:
5
ページ:
361-366
発行年:
2017年
JST資料番号:
D0456B
ISSN:
0049-8246
CODEN:
XRSPAX
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)