文献
J-GLOBAL ID:201702287277359829
整理番号:17A0473315
結晶化に及ぼすNK端XANES分光法とその影響を用いた蒸着したままの非晶質窒素ドープGeTe系相変化合金におけるN Te結合の検出【Powered by NICT】
Detection of N-Te bonds in the as-deposited amorphous nitrogen-doped GeTe-based phase change alloys using N K-edge XANES spectroscopy and their impact on crystallization
著者 (10件):
Krbal M.
(Faculty of Chemical Technology, Center of Materials and Nanotechnologies (CEMNAT), University of Pardubice, Legions Square 565, 530 02, Pardubice, Czechia)
,
Kolobov A.V.
(Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba, 305-8565, Ibaraki, Japan)
,
Kolobov A.V.
(Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Mikazuki, Hyogo, 679-5198, Japan)
,
Fons P.
(Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba, 305-8565, Ibaraki, Japan)
,
Fons P.
(Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Mikazuki, Hyogo, 679-5198, Japan)
,
Mitrofanov K.V.
(Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba, 305-8565, Ibaraki, Japan)
,
Tamenori Y.
(Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Mikazuki, Hyogo, 679-5198, Japan)
,
Hyot B.
(Laboratoire de Technologies pour la Nanophotonique, DOPT, SIONA, CEA Leti-MINATEC, 17 rue des martyrs, F-38054, Grenoble Cedex 9, France)
,
Andre B.
(Laboratoire de Technologies pour la Nanophotonique, DOPT, SIONA, CEA Leti-MINATEC, 17 rue des martyrs, F-38054, Grenoble Cedex 9, France)
,
Tominaga J.
(Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Higashi, Tsukuba, 305-8565, Ibaraki, Japan)
資料名:
Journal of Alloys and Compounds
(Journal of Alloys and Compounds)
巻:
704
ページ:
254-259
発行年:
2017年
JST資料番号:
D0083A
ISSN:
0925-8388
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)