文献
J-GLOBAL ID:201702288657515055
整理番号:17A0473323
硫化アンモニウム不動態化と急速熱アニーリングによるHfGdO/GaAsゲートスタックの界面と電気的性質の調節【Powered by NICT】
Modulation of interfacial and electrical properties of HfGdO/GaAs gate stacks by ammonium sulfide passivation and rapid thermal annealing
著者 (8件):
Jiang S.S.
(School of Physics and Materials Science, Radiation Detection Materials & Devices Lab, Anhui University, Hefei 230601, PR China)
,
He G.
(School of Physics and Materials Science, Radiation Detection Materials & Devices Lab, Anhui University, Hefei 230601, PR China)
,
Liang S.
(School of Physics and Materials Science, Radiation Detection Materials & Devices Lab, Anhui University, Hefei 230601, PR China)
,
Zhu L.
(School of Physics and Materials Science, Radiation Detection Materials & Devices Lab, Anhui University, Hefei 230601, PR China)
,
Li W.D.
(School of Physics and Materials Science, Radiation Detection Materials & Devices Lab, Anhui University, Hefei 230601, PR China)
,
Zheng C.Y.
(School of Physics and Materials Science, Radiation Detection Materials & Devices Lab, Anhui University, Hefei 230601, PR China)
,
Lv J.G.
(Department of Physics and Electronic Engineering, Hefei Normal University, Hefei 230061, PR China)
,
Liu M.
(Key Laboratory of Materials Physics, Anhui Key Laboratory of Nanomaterials and Nanostructure, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, PR China)
資料名:
Journal of Alloys and Compounds
(Journal of Alloys and Compounds)
巻:
704
ページ:
322-328
発行年:
2017年
JST資料番号:
D0083A
ISSN:
0925-8388
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)