文献
J-GLOBAL ID:201702288819947755
整理番号:17A1122200
(EMI)相乗Electromagnetic干渉に関連したバリウムヘキサフェライトと導電性高分子相の臨界濃度への機構的洞察遮蔽【Powered by NICT】
Mechanistic Insight into the Critical Concentration of Barium Hexaferrite and the Conductive Polymeric Phase with Respect to Synergistically Electromagnetic Interference (EMI) Shielding
著者 (6件):
Choudhary Harish K.
(Materials Research Centre, Indian Institute of Science, 560012, Bangalore, India)
,
Pawar Shital P.
(Department of Materials Engineering, Indian Institute of Science, 560012, Bangalore, India)
,
Kumar Rajeev
(Materials Research Centre, Indian Institute of Science, 560012, Bangalore, India)
,
Anupama A. V.
(Materials Research Centre, Indian Institute of Science, 560012, Bangalore, India)
,
Bose Suryasarathi
(Department of Materials Engineering, Indian Institute of Science, 560012, Bangalore, India)
,
Sahoo Balaram
(Materials Research Centre, Indian Institute of Science, 560012, Bangalore, India)
資料名:
Chemistryselect
(Chemistryselect)
巻:
2
号:
2
ページ:
830-841
発行年:
2017年
JST資料番号:
W2528A
ISSN:
2365-6549
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)