文献
J-GLOBAL ID:201702289147299165
整理番号:17A0365742
CVI設計された次元織物と3D SiC_f/SiC複合材料のシンクロトロンX線断層撮影特性評価【Powered by NICT】
Synchrotron X-ray tomographic characterization of CVI engineered 2D-woven and 3D-braided SiCf/SiC composites
著者 (7件):
Gao Yantao
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China)
,
Wang Yudan
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China)
,
Yang Xinmei
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China)
,
Liu Min
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China)
,
Xia Huihao
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China)
,
Huai Ping
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China)
,
Zhou Xingtai
(Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China)
資料名:
Ceramics International
(Ceramics International)
巻:
42
号:
15
ページ:
17137-17147
発行年:
2016年
JST資料番号:
H0705A
ISSN:
0272-8842
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)