文献
J-GLOBAL ID:201702289587251454
整理番号:17A1457632
多結晶薄膜光起電素子の解析と外部量子効率の予測のための分光偏光解析法【Powered by NICT】
Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency
著者 (8件):
Ibdah Abdel-Rahman
(Department of Physics & Astronomy and Wright Center for Photovoltaics Innovation & Commercialization, University of Toledo, Toledo, OH, 43606, USA)
,
Koirala Prakash
(Department of Physics & Astronomy and Wright Center for Photovoltaics Innovation & Commercialization, University of Toledo, Toledo, OH, 43606, USA)
,
Aryal Puruswottam
(Department of Physics & Astronomy and Wright Center for Photovoltaics Innovation & Commercialization, University of Toledo, Toledo, OH, 43606, USA)
,
Pradhan Puja
(Department of Physics & Astronomy and Wright Center for Photovoltaics Innovation & Commercialization, University of Toledo, Toledo, OH, 43606, USA)
,
Marsillac Sylvain
(Virginia Institute of Photovoltaics, Old Dominion University, Norfolk, VA 23529, USA)
,
Rockett Angus A.
(Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA)
,
Podraza Nikolas J.
(Department of Physics & Astronomy and Wright Center for Photovoltaics Innovation & Commercialization, University of Toledo, Toledo, OH, 43606, USA)
,
Collins Robert W.
(Department of Physics & Astronomy and Wright Center for Photovoltaics Innovation & Commercialization, University of Toledo, Toledo, OH, 43606, USA)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
421
号:
PB
ページ:
601-607
発行年:
2017年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)