文献
J-GLOBAL ID:201702290681784135
整理番号:17A0471316
ウエハスケール単分子層WO_3は超高感度,超高速で安定なUV-A光検出を窓【Powered by NICT】
Wafer-scaled monolayer WO3 windows ultra-sensitive, extremely-fast and stable UV-A photodetection
著者 (6件):
Hai Zhenyin
(Ghent University Global Campus, Department of Applied Analytical & Physical Chemistry, Faculty of Bioscience Engineering, 119 Songdomunhwa-ro, Yeonsu-gu, Incheon 21985, South Korea)
,
Akbari Mohammad Karbalaei
(Ghent University Global Campus, Department of Applied Analytical & Physical Chemistry, Faculty of Bioscience Engineering, 119 Songdomunhwa-ro, Yeonsu-gu, Incheon 21985, South Korea)
,
Xue Chenyang
(Key Laboratory of Instrumentation Science and Dynamic Measurement of Ministry of Education, North University of China, Taiyuan, Shanxi 030051, China)
,
Xu Hongyan
(School of Materials Science and Engineering, North University of China, Taiyuan, Shanxi 030051, China)
,
Hyde Lachlan
(Melbourne Centre for Nanofabrication, Clayton, Victoria 3168, Australia)
,
Zhuiykov Serge
(Ghent University Global Campus, Department of Applied Analytical & Physical Chemistry, Faculty of Bioscience Engineering, 119 Songdomunhwa-ro, Yeonsu-gu, Incheon 21985, South Korea)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
405
ページ:
169-177
発行年:
2017年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)