文献
J-GLOBAL ID:201702292171913342
整理番号:17A0371381
突然変異試験における変異体還元への道を意識したアプローチ【Powered by NICT】
A path-aware approach to mutant reduction in mutation testing
著者 (4件):
Sun Chang-ai
(School of Computer and Communication Engineering, University of Science and Technology Beijing, China)
,
Xue Feifei
(School of Computer and Communication Engineering, University of Science and Technology Beijing, China)
,
Liu Huai
(Australia-India Research Centre for Automation Software Engineering, RMIT University, Melbourne, Australia)
,
Zhang Xiangyu
(Department of Computer Science, Purdue University, West Lafayette, IN, USA)
資料名:
Information and Software Technology
(Information and Software Technology)
巻:
81
ページ:
65-81
発行年:
2017年
JST資料番号:
B0445B
ISSN:
0950-5849
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)