文献
J-GLOBAL ID:201702293115702479
整理番号:17A1906971
GaN/サファイアテンプレート上に成長させたGaN/AlN超格子における歪みの緩和に及ぼす井戸/障壁厚さ比の影響
Effect of well/barrier thickness ratio on strain relaxation in GaN/AlN superlattices grown on GaN/sapphire template
著者 (10件):
Kryvyi Serhii B.
(V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, 03028 Kiev, Ukraine)
,
Lytvyn Petro M.
(V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, 03028 Kiev, Ukraine)
,
Kladko Vasyl P.
(V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, 03028 Kiev, Ukraine)
,
Stanchu Hryhorii V.
(V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, 03028 Kiev, Ukraine)
,
Kuchuk Andrian V.
(Institute for Nanoscience and Engineering, University of Arkansas, West Dickson 731, Fayetteville, Arkansas 72701)
,
Mazur Yuriy. I.
(Institute for Nanoscience and Engineering, University of Arkansas, West Dickson 731, Fayetteville, Arkansas 72701)
,
Salamo Gregory J.
(Institute for Nanoscience and Engineering, University of Arkansas, West Dickson 731, Fayetteville, Arkansas 72701)
,
Li Shibin
(State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, 610054 Chengdu, China)
,
Kogutyuk Pavlo P.
(Taras Shevchenko National University of Kyiv, Volodymyrska street 64/13, 01601 Kyiv, Ukraine)
,
Belyaev Alexander E.
(V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Pr. Nauky 41, 03680 Kiev, Ukraine)
資料名:
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
(Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena)
巻:
35
号:
6
ページ:
062902-062902-6
発行年:
2017年11月
JST資料番号:
E0974A
ISSN:
2166-2746
CODEN:
JVTBD9
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)